Electrochemical Etching of Semiconductors
Introdution
Many systems from all fields of science possess a common and most fascinating property:
They may form patterns in space and/or time from originally uniform states when held far from thermodynamic
equilibrium. The basic concepts explaining such selforganization phenomena are often independent of the nature
of the specific system, i.e. they are universal.
We are interested in self-organizing processes occurring during electrochemical reactions at
the solid/liquid interface (especially at the electrolyte/semiconductor interface). Among the latter, our current interest is
the influence of long-range or nonlocal spatial coupling on spatio-temporal dynamics.
In electrochemical systems the range of the spatial coupling can be tuned continuously from
local or diffusive coupling to global coupling by easily accessible control parameters; thus they
are an ideal model system for the study of the effect of coupling range on pattern formation.
Electrochemical Reactions at the Semiconductor-Electrolyte Inferface
Research of the anodic dissolution of semiconductors in different electrolytes yields an increasing number of phenomena
which may be most generally characterized as current oscillations in time and space. Oscillations in time comprise not
only stable current (or voltage) oscillations at constant voltage (or current, respectively) but also damped current
oscillations and oscillations hidden in noise. Current oscillations in space are better known as pits or pores, and
it is the large variety of pores obtainable in Si by probing the available parameter space together with the potential
for novel products that finds increasing interest in the scientific community. Pore geometry's and morphologies comprise
spongelike structures in the nanometer range (generally addressed as micropores), mesopores in the 10 nm – 100 nm
range always following <100> directions, “well-formed” macropores in the micrometer range - straight, smooth, and
with aspect ratios of 500 and larger - heavily branched macropores with rather peculiar morphologies, and two-dimensional
structures termed "trenches" and "wings". In addition, the dependence of the pore morphology on crystal orientation
shows peculiar effects, e.g. pore growth directions in <113>.
Many attempts have been made to understand the dissolution process and the mechanisms responsible for its apparent instability
in space and time. While much pro-gress has been made in recent years, much remains mysterious and there is a general lack of predictive power.
Moreover, a whole new world of electrochemically formed pores emerges in other semiconductors with many similarities to
Si, but also many differences and most likely a wealth of phenomena not yet discovered.
It appears to be an over ambitious and hopeless goal to understand these and other phenomena from just a few basic
principles – and that may well be the realistic of view of the subject.
THE ESSENTIALS OF THE CURRENT BURST MODEL
The current burst model is based on the following major assumptions which will be made more specific later on:
- Current flow through the Si electrode is inhomogeneous in time and space - it occurs in "current bursts" (CB). T
his means that charge transfer at some point r on the sur-face occurs for some (short) time span t in a small
area (roughly 1 nm2) around r. The next current burst occurring within delta r will be delayed by some
waiting time tw. During the time of charge transfer chemical reactions of the Si occur; these are essentially direct
dissolution and oxidation. During the waiting time other chemical reactions occur, essentially oxide dissolution and
hydrogen passivation of the free Si surface.
- Current bursts have an intrinsically stochastic nature. The nucleation of the charge transfer process
and the two time constants t and tw are not fixed values but are given by some distribution function which
is determined by the system parameters. Nevertheless, the total average duration of a current burst defines
an intrinsic time constant CB = tC + tw of the electrochemical system which should express itself in the
dynamics of the system.
- Current bursts may interact in space and/or time. This means that the nucleation probability
and/or the individual properties of a CB at r and t may depend on the state of current bursts at r + r
(interaction in space) or at t - t (interaction in time).
While these assumptions project a radical departure form conventional views of the (homogeneous) electrode processes,
it is obvious that the three basic chemical processes at the electrode – direct dissolution, oxidation and oxide
dissolution – can not all occur at the same time and space - the electrode state thus must be inhomogeneous at some
scale by necessity. The CBM essentially exploits this point by specifying the sequence of reactions as a current burst
and the resulting electrode state by the interaction of current bursts.
Voltage Osciallations during Pore Growth
AGING CONCEPT
While at high current densities the semiconductor surface is completely covered with oxide at low current densities,
most of the semiconductor surface will be in direct contact to the elec-trolyte. It is well known that after chemical
dissolution the free surface is passivated, i.e. the density of surface states reduces as a function of time which
increases the stability of the sur-face against further electrochemical attack. For the example of silicon the speed
and the per-fection of passivation of the (111) crystallographic surface is larger than for the (100) surface. This
selective aging of surfaces leads to a self amplifying dissolution of (100) surfaces (which will become pore tips)
and a preferential passivation of (111) surfaces (which will become pore walls). Under optimized chemical conditions
with an extremely large passivation differ-ence between (111) and (100) surfaces a self organized growth of octahedral
cavities occurs. The octahedra consists of (111) pore walls. As soon as the complete surface of the octahedra reaches
a critical value, it is easier to start a new cavity at a (100) tip of the old cavity, since the current density in the new,
small cavity is larger and no surface passivation will occur until the surface again becomes to large. This growing
mechanism leads to an oscillation of both the current through each pore and the diameter of each pore as a
function of time – see Figure 1. As in the case of a compound semiconductor the surface aging of III-V compounds
is more complicated since there exist two (111) surfaces, e.g. GaAs only the {111} A planes (Ga-rich planes) appear
as stopping planes. So in most III-V compounds not ocahedrons are etched but thetrahedra with four (111)A planes as
stopping planes.
An other example of the aging effect in case of compound semiconductors is the formation of a nucleation layer.
Figure 1 - Selfinduced Oscialltions during Pore Growth in InP
A rather spectacular consequence of the surface aging concept is demonstrated in Figure 1 for InP.
A lateral interaction of pores can occur by a next neighbor interaction due to an overlap of the space charge region.
Etching InP at very high current densities is accompanied by self induced voltage oscillations (for details see publications).
Each peak in the voltage corresponds to an increase of the pore diameters for all pores as seen in Figure 1.
Globale Selforganization
There is, however, a most spectacular additional manifestation of self-organization: the formation of a
two-dimensional single pore crystal in InP under certain conditions; Fig. 2 shows some examples.
In contrast to e.g. self-organized pore crystal in Al2O3, the InP pore crystals are single crystals
(demonstrated by the Fourier transform in Figure 3) which, to the best of our knowledge, makes then unique.
Figure 2 - Selorganized Pores in InP
Figure 3 - FFT
Conclusions
While there are many known modes of pore etching in Si (and possibly more to be discovered), a general
understanding of the formation processes has not yet been achieved. Technical uses of macropores are
nevertheless possible, and a rapidly growing number of applications is under investigation. While large area
etching is not easy, it is possible and has been demonstrated.
Publications:
-
Pore Formation Mechanisms for the Si-HF System
J. Carstensen, M. Christophersen, H. Föll, Mat. Sci. Eng. B, 69-70, 23 (2000)
- Self-organized pore formation and open-loop-control in semiconductor etching
J. C. Claussen, J. Carstensen, M. Christophersen, S. Langa, H. Föll, Choas, 13(1), 217-224, 2003
- A comparison of pores in silicon and pores in III-V compound materials
M. Christophersen, S. Langa, J. Carstensen, I. M. Tiginyanu, H. Föll, Phys. Stat. Sol. (a), 197, 197, 2003
Back to M. Christophersen's homepage
Last modified: 04/25/04
URL: http://www.marc-christophersen.de